Testability Trade-Offs for BIST Data Paths
نویسندگان
چکیده
Power dissipation during test application is an emerging problem due to yield and reliability concerns. This paper focuses on BIST for RTL data paths and discusses testability trade-offs in terms of test application time, BIST area overhead and power dissipation.
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ورودعنوان ژورنال:
- J. Electronic Testing
دوره 20 شماره
صفحات -
تاریخ انتشار 2004